Synchrotron X-ray Scattering Studies on the Morphology of Organic Solar Cells

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Title
Synchrotron X-ray Scattering Studies on the Morphology of Organic Solar Cells
Speaker
Xinhui Lu, The Chinese University of Hong Kong
Date & Time
Monday, July 17, 2017 -
14:00 to 15:00
Location
Room 264, Geography Building, Zhongbei Campus, 3663 Zhongshan Road North, Shanghai

Abstract of the talk

Nowadays, solar industry becomes the fastest growing industry due to the rising demands to solve energy crisis and environmental problems. Organic photovoltaic (OPV) devices, as one of the most promising technologies offering low-cost, light weight and flexible solar cells, have attracted more and more attentions. The main challenge of OPV devices is the relatively low power conversion efficiency due to limitations in exciton diffusion, charge separation and transportation inside the organic active layers. It is widely believed that the morphology of the active layer is closely related to these electronic properties, and thus crucial to the device performance. Here, I am going to present our recent work on the active layer morphology and its correlations with device performances for several different OPV systems. Grazing incidence X-ray scattering techniques have been employed to investigate the active layer morphology: grazing incidence wide-angle X-ray scattering (GIWAXS) for Angstrom-scale ordering, such as molecular packing and orientation; grazing incidence small-angle X-ray scattering (GISAXS) for nano-scale ordering, such as donor-acceptor phase separation and miscibility.    

Biography of the Speaker

Xinhui Lu is currently Assistant Professor of Physics at The Chinese University of Hong Kong. Dr. Lu received her Ph.D. from Yale University in 2010, and bachelor degree from Nanjing University in 2004. She joined The Chinese University of Hong Kong in 2012 as Research Assistant Professor, and was promoted to Assistant Professor in 2016.

Her research interests include: Soft matter, Photovoltaic devices, X-ray scattering.

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Location & Details

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